Bringing optics into the nanoscale – a double-scanner AFM brings advanced optical experiments within reach
![Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy | Semantic Scholar Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/c9ee3dfe44eb7c4216f8a7114dc60ca86e8a027f/2-Figure1-1.png)
Artificial neural network based hysteresis compensation for piezoelectric tube scanner in atomic force microscopy | Semantic Scholar
![Design of a high‐bandwidth tripod scanner for high speed atomic force microscopy - Yang - 2016 - Scanning - Wiley Online Library Design of a high‐bandwidth tripod scanner for high speed atomic force microscopy - Yang - 2016 - Scanning - Wiley Online Library](https://onlinelibrary.wiley.com/cms/asset/fd587428-e2e8-467d-ac5a-776ae0472acb/sca21338-fig-0001-m.jpg)
Design of a high‐bandwidth tripod scanner for high speed atomic force microscopy - Yang - 2016 - Scanning - Wiley Online Library
![AFM hardware configuration. (A) AFM head (or Scanner) in the stand is... | Download Scientific Diagram AFM hardware configuration. (A) AFM head (or Scanner) in the stand is... | Download Scientific Diagram](https://www.researchgate.net/publication/301832034/figure/fig7/AS:668875742015496@1536483812518/AFM-hardware-configuration-A-AFM-head-or-Scanner-in-the-stand-is-shown-The.png)